Advanced Materials Characterization (5op)

Osaamistavoitteet

After completing the course, the student is able to classify and can explain the principles of (scanning) transmission electron microscopy (S/TEM) including operation, image and contrast formation, electron diffraction and related microanalysis methods and special techniques in TEM. In addition, the student knows the principles of focused ion beam (FIB) and electron backscatter diffraction (EBSD) methods, atomic force microscopy (AFM), Raman spectroscopy, digital image correlation (DIC) methods, micro-/nanomechanics and advanced X-ray diffraction (XRD) techniques. The student can apply this information in practical exercises which include e.g. demonstrations. The student is able to understand and apply suitable specimen preparation techniques and to identify special analysis techniques.

Sisältö

Ydinsisältö(Scanning) transmission electron microscopy (S/TEM) with microanalysis and special techniquesFocused ion beam (FIB) technique Electron backscatter diffraction (EBSD) methods Atomic force microscopy (AFM)Raman spectroscopyDigital image correlation (DIC) methodsMicro-/nanomechanics Advanced X-ray diffraction (XRD) techniques 

Esitietovaatimukset

PrerequisiteCode: MOL-32228Name: Electron MicroscopyECTS credits: 5Mandatory: Mandatory

Lisätiedot

Opintojakso soveltuu jatko-opinnoiksi.Osasuoritusten pitää liittyä samaan toteutuskertaan.